NI PXIE-5673E 矢量信號發生器 PDF資料
1.產 品 資 料 介 紹：
中文資料：
NI PXIe-5673E 是國家儀器（NI）推出的一款高性能矢量信號發生器，適用于自動化測試與測量，特別在無線通信和射頻（RF）領域有廣泛應用。
主要特點：
頻率范圍：
- 支持 50 MHz 到 6.6 GHz 的頻率范圍，能夠覆蓋廣泛的無線通信頻段。
高帶寬性能：
- 提供高達 100 MHz 的瞬時帶寬，能夠滿足高頻寬信號生成需求，適用于高速數據通信測試。
多通道同步：
- 支持多達 4 個同步通道，能夠在同一設備上實現多通道的信號生成，適用于 MIMO (多輸入多輸出) 和波束成形等技術測試。
靈活的 RF 列表模式：
- 提供 RF 列表模式，支持快速、確定性的信號配置更改，從而提升測試效率，特別適用于信號的快速切換與測試。
高精度：
- 具備高精度的信號輸出，能夠生成穩定且低失真的信號，確保測試結果的可靠性。
應用領域：
- 無線通信： 用于測試無線設備和系統，特別是在5G、LTE、Wi-Fi等通信技術的驗證過程中應用廣泛。
- 射頻（RF）測試： 用于射頻元器件、系統和模塊的驗證。
- 半導體測試： 適用于半導體設備的射頻性能測試，確保器件在特定頻率范圍內的工作穩定性。
- 科研與教育： 作為科研實驗和教育實驗中的信號生成工具，廣泛應用于電氣工程與通信技術的實驗教學。
維護與支持：
- NI 提供全面的技術支持和設備校準服務，確保 PXIe-5673E 長期穩定運行。對于設備出現的任何問題，NI 也提供專業的故障排除和維修服務。
英文資料：
NI PXIe-5673E is a high-performance vector signal generator launched by National Instruments (NI), suitable for automated testing and measurement, particularly in the fields of wireless communication and radio frequency (RF).
Main features:
Frequency range:
Supports a frequency range of 50 MHz to 6.6 GHz, capable of covering a wide range of wireless communication frequency bands.
High bandwidth performance:
Providing an instantaneous bandwidth of up to 100 MHz, it can meet the requirements of high bandwidth signal generation and is suitable for high-speed data communication testing.
Multi channel synchronization:
Supports up to 4 synchronous channels, enabling multi-channel signal generation on the same device, suitable for MIMO (Multiple Input Multiple Output) and beamforming technology testing.
Flexible RF List Mode:
Provide RF list mode, support fast and deterministic signal configuration changes, thereby improving testing efficiency, especially suitable for fast signal switching and testing.
high-precision:
Equipped with high-precision signal output, capable of generating stable and low distortion signals, ensuring the reliability of test results.
Application areas:
Wireless communication: widely used for testing wireless devices and systems, especially in the verification process of communication technologies such as 5G, LTE, Wi Fi, etc.
Radio frequency (RF) testing: used for verifying RF components, systems, and modules.
Semiconductor testing: Suitable for RF performance testing of semiconductor equipment to ensure the stability of the device within a specific frequency range.
Research and Education: As a signal generation tool in scientific and educational experiments, it is widely used in experimental teaching of electrical engineering and communication technology.
Maintenance and Support:
NI provides comprehensive technical support and equipment calibration services to ensure the long-term stable operation of PXIe-5673E. NI also provides professional troubleshooting and repair services for any issues that may arise with the equipment.
2.產 品 展 示
3.其他產品
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