AGILENT 5517C激光紅色干涉儀 PDF資料
1.產 品 資 料 介 紹：
中文資料：
Agilent 5517C 激光紅色干涉儀 是由 Agilent Technologies（安捷倫科技） 生產的一款高精度干涉儀，主要用于精密測量和表面形貌分析。Agillent 5517C 是干涉儀產品線中的一款高端型號，專為高精度光學干涉測量設計，適用于各種高精度測量領域，尤其是在科學研究、制造業、半導體制造和精密機械加工等領域具有重要應用。
主要特點：
高精度測量：
- Agilent 5517C 激光紅色干涉儀使用激光干涉技術，提供納米級的精度測量。其分辨率可以達到納米級別，適用于對表面形貌、位移、振動等參數的精密測量。
- 通過干涉原理，能夠精確測量物體表面的微小變化，例如厚度、形狀、間隙、表面輪廓等。
激光源：
- 采用紅色激光源（波長為 632.8 nm），該波長的激光具有高穩定性和精度，能夠提供清晰、穩定的干涉條紋，進而確保測量結果的高準確性。
- 激光的使用可以提高系統的信號強度，保證在復雜的實驗環境下仍能獲得精確的測量結果。
干涉原理：
- 該儀器基于激光干涉原理工作。通過比較參考光束與測試物體反射光束的相位差，Agilent 5517C 可以精確地計算出物體表面或位移的微小變化。
- 干涉儀通過分析干涉條紋的變化，可以測量表面形貌、物體的運動或位移，適用于動態測量和靜態測量。
適用領域：
- 光學表面測量：用于測量表面形貌，如平面度、表面粗糙度等。
- 位移與振動測量：適用于高精度位移測量和動態振動分析，常用于精密機械和自動化設備的測試。
- 微型組件與半導體測量：廣泛應用于半導體制造中的微型元件和微結構的測量，確保產品的尺寸精度。
- 研究與開發：在科研領域，特別是物理學、材料科學和納米技術的研究中，5517C 激光干涉儀可以提供準確的表面分析數據。
高穩定性與重復性：
- 該設備具備優異的穩定性，能夠提供高重復性、低噪聲的測量結果。即便在環境條件變化較大的情況下，仍然能夠保持高精度。
用戶友好的界面：
- Agilent 5517C 配備直觀的操作界面，用戶可以輕松設置和操作儀器，進行測量和數據分析。
- 提供各種數據輸出格式，方便用戶對測量結果進行記錄、處理和進一步分析。
多種應用附件與功能：
- 該設備可與多種附件搭配使用，如光學反射鏡、探測器、掃描平臺等，以擴展其功能和應用范圍。適用于不同的測量任務和工件尺寸。
- 還可以進行現場實時測量，適合在生產線或實驗室環境中使用。
英文資料：
The Agilent 5517C laser red interferometer is a high-precision interferometer produced by Agilent Technologies, mainly used for precision measurement and surface morphology analysis. Agillent 5517C is a high-end model in the interferometer product line, designed specifically for high-precision optical interferometry measurement. It is suitable for various high-precision measurement fields, especially in scientific research, manufacturing, semiconductor manufacturing, and precision machining, and has important applications.
Main features:
High precision measurement:
The Agilent 5517C laser red interferometer uses laser interferometry technology to provide nanometer level precision measurements. Its resolution can reach the nanometer level, suitable for precise measurement of surface morphology, displacement, vibration and other parameters.
Through the principle of interference, it is possible to accurately measure small changes on the surface of an object, such as thickness, shape, gaps, surface contours, etc.
Laser source:
Using a red laser source (wavelength of 632.8 nm), this wavelength of laser has high stability and accuracy, providing clear and stable interference fringes to ensure high accuracy of measurement results.
The use of lasers can improve the signal strength of the system, ensuring accurate measurement results even in complex experimental environments.
Interference principle:
This instrument operates based on the principle of laser interference. By comparing the phase difference between the reference beam and the reflected beam of the test object, Agilent 5517C can accurately calculate small changes in the surface or displacement of the object.
Interferometers can measure surface morphology, object motion or displacement by analyzing the changes in interference fringes, and are suitable for dynamic and static measurements.
Applicable fields:
Optical surface measurement: used to measure surface morphology, such as flatness, surface roughness, etc.
Displacement and vibration measurement: suitable for high-precision displacement measurement and dynamic vibration analysis, commonly used for testing precision machinery and automation equipment.
Micro components and semiconductor measurement: widely used in the measurement of micro components and microstructures in semiconductor manufacturing to ensure the dimensional accuracy of products.
Research and development: In the field of scientific research, especially in physics, materials science, and nanotechnology, the 5517C laser interferometer can provide accurate surface analysis data.
High stability and repeatability:
This device has excellent stability and can provide measurement results with high repeatability and low noise. Even under significant changes in environmental conditions, high accuracy can still be maintained.
User friendly interface:
The Agilent 5517C is equipped with an intuitive user interface, allowing users to easily set up and operate the instrument for measurement and data analysis.
Provide various data output formats to facilitate users in recording, processing, and further analyzing measurement results.
Multiple application attachments and functions:
This device can be used in conjunction with various accessories, such as optical mirrors, detectors, scanning platforms, etc., to expand its functionality and application range. Suitable for different measurement tasks and workpiece sizes.
It can also perform real-time on-site measurements, suitable for use in production lines or laboratory environments.
2.產 品 展 示
3.其他產品
4.其他英文產品
GESVDU-1D-8946 Input/Output Module
ABB UN0807C-P Programmable Controller
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| E10038-33VM61-030 | S60300-EI | IMASO11 |
| DVC 550 | CACR-SR05AB1ERY3-V | EPC-161316AE |
| DVC 310 | CACR-PR30BC3CSY166E | 48964402-D, |
| DS200SIOBH1A | 6DD1681-0DJ1 | ICS TRIPLEX TC-801-02- .4M5 |
| DS200DCFBG1BLC | CACR-SR30SZ1SDY230 | EXP-BP3A |
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